Development and Application of Fault Detectability Performance Metrics for Instrument Calibration Verification and Anomaly Detection
J. Wesley Hines, Dustin R. Garvey Cited by 45
Data Adaptive Simultaneous Parameter and Kernel Selection in Kernel Discriminant Analysis Using Information Complexity
Caterina Liberati, J. Andrew Howe, Hamparsum Bozdogan Cited by 12
QMOS - a Robust Visualization Method for Speaker Dependencies With Different Microphones
Andreas Maier, Maria Schuster, Ulrich Eysholdt, Tino Haderlein, Tobias Cincarek, Stefan Steidl, Anton Batliner, Stefan Wenhardt, Elmar Nöth Cited by 6
Illumination Chromaticity Estimation Using Linear Learning Methods
Vivek Agarwal, Andrei Gribok, Andreas Koschan, Besma R. Abidi, Mongi A. Abidi Cited by 9
The Journal of Pattern Recognition Research (JPRR) provides an international forum for the electronic publication of high-quality research and industrial experience articles in all areas of pattern recognition, machine learning, and artificial intelligence. JPRR is committed to rigorous yet rapid reviewing. Final versions are published electronically (ISSN 1558-884X) immediately upon acceptance.