Vol 1, No 1 (2006)
Table of Contents
Short Letters
Pattern Analysis
Applications
Development and Application of Fault Detectability Performance Metrics for Instrument Calibration Verification and Anomaly Detection 2-15
J. Wesley Hines, Dustin R. Garvey
Image Fusion and Enhancement via Empirical Mode Decomposition 16-31
H. Hariharan, Andrei Gribok, M. A. Abidi, A. Koschan
Model-Fitting Approaches to Reliability Assessment and Prognostic Problems 32-36
Aleksander Usynin
An Overview of Color Constancy Algorithms 42-54
Vivek Agarwal, B. Abidi, A. Koschan, M. A. Abidi